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APA Citation
Meffert, M., Störmer, H., & Gerthsen, D. (n.d.). dopant-Site Determination in Y- and Sc-Doped (Ba0.5Sr0.5)(Co0.8Fe0.2)O3−δ by Atom Location by Channeling Enhanced Microanalysis and the Role of Dopant Site on Secondary Phase Formation. Microscopy and microanalysis, 22, 113–121. http://access.bl.uk/ark:/81055/vdc_100056536125.0x000021