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HARVARD Citation
Meffert, M. et al. (n.d.). Dopant-Site Determination in Y- and Sc-Doped (Ba0.5Sr0.5)(Co0.8Fe0.2)O3−δ by Atom Location by Channeling Enhanced Microanalysis and the Role of Dopant Site on Secondary Phase Formation. Microscopy and microanalysis. pp. 113-121. [Online].