Cite
APA Citation
Rhee, J., Choi, S., Kang, H., Kim, J., Ko, D., Ahn, G., Jung, H., Choi, S., Myong Kim, D., & Kim, D. H. (2018). the electron trap parameter extraction-based investigation of the relationship between charge trapping and activation energy in IGZO TFTs under positive bias temperature stress. Solid-state electronics, 140, 90–95. http://access.bl.uk/ark:/81055/vdc_100056542987.0x000055