Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis. (September 2017)

• Record Type: Journal Article
• Authors: Pouget, V.; Jonathas, S.; Job, R.; Vaillé, J.R.; Wrobel, F.; Saigné, F.
• Is Part Of: Microelectronics and reliability. Volume 76/77(2017)
• Page Start: 650
• Page End: 654
• Publication Date: 2017-09
• Subjects: Laser testing -- Single-event effects -- Fault injection -- Two-photon laser stimulation; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2017.07.028
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: This paper presents a methodology for analysing two-photon absorption laser testing results in the frequency domain rather than with the classical mapping approach. We experimentally demonstrate, on a 28 nm device, the extraction of subwavelength dimensions from a noisy environment without requiring any synchronization between the test operations and the laser or the scan motion. A model of the experiment is then used to evaluate the impact of different parameters on the capabilities of the technique. Highlights: Laser-injected faults are logged and analysed in the frequency domain. A sub-wavelength spatial period of a sensitivity pattern of the 28 nm SoC under test is extracted. The method requires no synchronization between the test-loop and the laser bench. The laser spot size is found to have no significant impact on the technique resolution.