Cite
HARVARD Citation
Ritter, M. et al. (2017). Aging sensors for on-chip metallization of integrated LDMOS transistors under cyclic thermo-mechanical stress. Microelectronics and reliability. pp. 512-516. [Online].
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Ritter, M. et al. (2017). Aging sensors for on-chip metallization of integrated LDMOS transistors under cyclic thermo-mechanical stress. Microelectronics and reliability. pp. 512-516. [Online].