Design methodology for over-temperature and over-current protection of an LDO voltage regulator by using electro-thermal simulations. (December 2017)

• Record Type: Journal Article
• Authors: Plesa, Cosmin-Sorin; Neag, Marius; Boianceanu, Cristian; Negoita, Andrei
• Is Part Of: Microelectronics and reliability. Volume 79(2017)
• Page Start: 509
• Page End: 516
• Publication Date: 2017-12
• Subjects: Over-temperature protection -- Over-current protection -- LDO -- Electro-thermal simulations -- Design methodology; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2017.03.028
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: This paper presents a methodology for designing over-temperature and over-current protection (OTP and OCP) circuits for low drop-out voltage regulators (LDOs). The OTP monitors the die temperature developed within the LDO and disables its output stage when the temperature reaches a certain, user-defined, level (the OTP activation point). If the LDO output current reaches a set threshold (the OCP activation point), the OCP takes control of it, keeping the current value to an acceptable level. The proposed methodology involves running iteratively electrical, thermal and electro-thermal simulations. It addresses three major issues: first, it allows the designer to identify the suitable layout placement of the OTP and OCP sensors, based on the temperature distribution within the LDO power-stage. Second, the OTP and OCP activation points can be set accurately by taking into account coupled electro-thermal phenomena and the unavoidable differences between the temperature and current sensed by the protection circuits and those developed within the worst-case LDO section. Finally, the LDO design can be fine-tuned considering complex scenarios of real-life operation and test requirements. An LDO was designed using this methodology and the paper provides a direct comparison between the expected (simulated) results and measurements performed on the silicon implementation. Highlights: A methodology for designing over-temperature and over-curent protection circuits for LDOs is presented The proposed methodology involves running iteratively electrical, thermal and electro-thermal simulations A design example is presented: the proposed methodology was used to design an LDO for automotive applications Measurements performed on the integrated LDO validated the design methodology