Cite
MLA Citation
D.K. Panda and T.R. Lenka. “Effects of trap density on drain current LFN and its model development for E-mode GaN MOS-HEMT.” Superlattices and microstructures, vol. 112, 2017, pp. 374–382. http://access.bl.uk/ark:/81055/vdc_100053781375.0x00002e