Cite
HARVARD Citation
Panda, D. et al. (2017). Effects of trap density on drain current LFN and its model development for E-mode GaN MOS-HEMT. Superlattices and microstructures. pp. 374-382. [Online].
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Panda, D. et al. (2017). Effects of trap density on drain current LFN and its model development for E-mode GaN MOS-HEMT. Superlattices and microstructures. pp. 374-382. [Online].