Cite
APA Citation
Li, X., Dong, S., Jin, H., Miao, M., Hu, T., Guo, W., & Wong, H. (2017). 28 nm CMOS process ESD protection based on diode-triggered silicon controlled rectifier. Solid-state electronics, 137, 128–133. http://access.bl.uk/ark:/81055/vdc_100051216007.0x00005c