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APA Citation
Li, J., Cheng, K., Khakifirooz, A., Wang, J., Reznicek, A., Madan, A., Dons, B., Loubet, N., He, H., & Gaudiello, J. (n.d.). strain Quantification Analysis of Epitaxial SiGe on SOI by Nanobeam Diffraction (NBD). Microscopy and microanalysis, 20, 1070–1071. http://access.bl.uk/ark:/81055/vdc_100050741952.0x00002b