Cite
APA Citation
Man, X., Asahata, T., Uemoto, A., Susuki, H., Suzuki, H., Hasuda, M., & Fujii, T. (n.d.). 3D Atom Probe Microscopy Sample Preparation by Using L-Shape FIB-SEM-Ar Triple Beam. Microscopy and microanalysis, 20, 354–355. http://access.bl.uk/ark:/81055/vdc_100050736155.0x00001d