Cite

MLA Citation

    Matthew Hiscock et al.. “In-Situ Quantification of TEM Lamella Thickness and Ga Implantation in the FIB.” Microscopy and microanalysis, vol. 20, n.d., pp. 342–343. http://access.bl.uk/ark:/81055/vdc_100050733521.0x00003b
  
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