Cite
APA Citation
Bowers, M., Phillips, P., Kwon, J., Brandes, M., Mills, M., & De Graef, M. (n.d.). zone Axis STEM Defect Imaging Based on Electron Kossel Patterns. Microscopy and microanalysis, 20, 114–115. http://access.bl.uk/ark:/81055/vdc_100050731801.0x000022