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Bowers, M. et al. (n.d.). Zone Axis STEM Defect Imaging Based on Electron Kossel Patterns. Microscopy and microanalysis. pp. 114-115. [Online].
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Bowers, M. et al. (n.d.). Zone Axis STEM Defect Imaging Based on Electron Kossel Patterns. Microscopy and microanalysis. pp. 114-115. [Online].