Cite
MLA Citation
Matthieu Picher et al.. “Optical Spectroscopy Integrated with Environmental Scanning Transmission Electron Microscope: A Comprehensive In Situ Characterization Platform.” Microscopy and microanalysis, vol. 20, n.d., pp. 1748–1749. http://access.bl.uk/ark:/81055/vdc_100050731313.0x00001c