Analysis by Monte-Carlo simulation of uncapped nanocrystals density effects on the collection efficiency. (September 2017)

• Record Type: Journal Article
• Authors: Doan, QuangTri; El Hdiy, Abdelillah; Duong, Xuan-Nui; Duong, Chinh-Cuong; Nguyen, Luong-Thien
• Is Part Of: Superlattices and microstructures. Volume 109(2017)
• Page Start: 273
• Page End: 278
• Publication Date: 2017-09
• Subjects: Monte-Carlo simulation -- Nano-EBIC -- Nanocrystal -- Surface recombination velocity -- Collection/capture probability; Superlattices as materials -- Periodicals; Microstructure -- Periodicals; Semiconductors -- Periodicals; Superréseaux -- Périodiques; Microstructure (Physique) -- Périodiques; Semiconducteurs -- Périodiques; 621.38152
• DOI: 10.1016/j.spmi.2017.05.004
• Languages: English
• ISSNs: 0749-6036

Abstract

Abstract: The effects of nanocrystals density on the electron beam induced current are studied by the use of Monte-Carlo simulation. The nanocrystals are considered as recombination centers for captured charges and are distributed randomly at the sample surface. The induced current is collected by a nanocontact. The surface recombination velocity at the free surface is supposed to be zero. For a given electron beam energy, simulated results show a decrease of the carrier collection efficiency and shrinkage of its profile when the nanocrystals density increases. As a consequence, the minority carrier effective diffusion length which is extracted from simulated results is a decreasing function. This is not surprising because it is well known that an increase of recombination centers leads to reduction of the minority carrier lifetime and then a reduction of their diffusion length. These effects are highlighted because of both collecting electrode small size and perpendicular configuration. Highlights: Monte-Carlo simulation of the nano-EBIC technique. Random distribution of uncapped nanocrystals at the surface. Carrier trapping process in nanocrystals and its effects on the nano-EBIC current.