Cite
HARVARD Citation
Grünwald, E. et al. (n.d.). Laser Ultrasonic Thin Film Characterization of Si-Cu-Al-Cu Multi-Layered Stacks. Materials today. pp. 7122-7127. [Online].
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Grünwald, E. et al. (n.d.). Laser Ultrasonic Thin Film Characterization of Si-Cu-Al-Cu Multi-Layered Stacks. Materials today. pp. 7122-7127. [Online].