Cite
HARVARD Citation
Hernandez, I. et al. (2017). Characterization of MIS structures and thin film transistors using RF-sputtered HfO2/HIZO layers. Microelectronics and reliability. pp. 9-13. [Online].
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Hernandez, I. et al. (2017). Characterization of MIS structures and thin film transistors using RF-sputtered HfO2/HIZO layers. Microelectronics and reliability. pp. 9-13. [Online].