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APA Citation
Ida, T., Wachi, K., Hattan, D., Ono, S., Tachiki, S., Nakanishi, Y., Sakuma, Y., Wada, A., & Towata, S. (n.d.). analysis of powder diffraction data collected with synchrotron X-ray and multiple 2D X-ray detectors applying a beta-distribution peak profile model. Powder diffraction, 32, S172–S178. http://access.bl.uk/ark:/81055/vdc_100049223245.0x00003c