Cite
HARVARD Citation
Ida, T. et al. (n.d.). Analysis of powder diffraction data collected with synchrotron X-ray and multiple 2D X-ray detectors applying a beta-distribution peak profile model. Powder diffraction. pp. S172-S178. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Ida, T. et al. (n.d.). Analysis of powder diffraction data collected with synchrotron X-ray and multiple 2D X-ray detectors applying a beta-distribution peak profile model. Powder diffraction. pp. S172-S178. [Online].