Cite
APA Citation
Xu, X., Clarke, C., Ma, C., Casillas, G., Das, M., Guan, M., Liu, D., Wang, L., Tadich, A., Du, Y., Ton-That, C., & Jin, D. (2017). depth-profiling of Yb3+ sensitizer ions in NaYF4 upconversion nanoparticles. Nanoscale, 9(23), 7719–7726. http://access.bl.uk/ark:/81055/vdc_100047134922.0x000039