Cite
HARVARD Citation
Thuvander, M. et al. (eds.) (2017). Atom Probe Tomography & Microscopy APT&M 2016 From Science to Industry Organized under the auspices of the International Field Emission Society June 12th–17th, 2016, Gyeongju, Korea. Microscopy and microanalysis. pp. 187-193. [Online].