Band gap measurement of Bi2MoxW1-xO6 by low loss electron energy loss spectroscopy. (1st June 2017)
- Record Type:
- Journal Article
- Title:
- Band gap measurement of Bi2MoxW1-xO6 by low loss electron energy loss spectroscopy. (1st June 2017)
- Main Title:
- Band gap measurement of Bi2MoxW1-xO6 by low loss electron energy loss spectroscopy
- Authors:
- Morales-Cruz, Damasio
Paraguay-Delgado, Francisco
Borja-Urby, Raúl
Basurto-Cereceda, Sofía
Herrera-Pérez, Guillermo
Longo, Paolo
Malac, Marek - Abstract:
- Abstract: This work shows the comparison of high-resolution electron energy loss spectra (HR-EELS) in the low loss region (0−15 eV) to investigate the electronic structure from koechilinite Bi2 MoO6 to rusellite Bi2 WO6 varying the stoichiometric relation Bi2 Mox W1−x O6 . The effect of the Mo to W ratio on the bandgap energy was evaluated on individual particles. Two approximations were considered in order to determine the band gap energy value, the first one was a linear fit and the second one was a mathematical fit. Both analyses are in agreement with those ones collected and analyzed by UV–Vis characterization. Our results suggest a direct electronic transition that increases from about 2.53 eV to about 3 eV as the W content increase from 0% to 100% wt. X-ray diffraction was used to corroborate the crystal structure and crystal size; transmission electron microscopy was used to monitor the morphology evolution and UV–Vis spectroscopy in diffuse reflectance mode to determine the Eg. These techniques complement the characterization of these materials. Highlights: Analysis of the low loss energy region using HR-EELS. Energy loss function was determined by the K-K analysis. The fitting suggests a direct electronic transition.
- Is Part Of:
- Materials science in semiconductor processing. Volume 63(2017)
- Journal:
- Materials science in semiconductor processing
- Issue:
- Volume 63(2017)
- Issue Display:
- Volume 63, Issue 2017 (2017)
- Year:
- 2017
- Volume:
- 63
- Issue:
- 2017
- Issue Sort Value:
- 2017-0063-2017-0000
- Page Start:
- 184
- Page End:
- 189
- Publication Date:
- 2017-06-01
- Subjects:
- Electron energy loss spectroscopy (EELS) -- Transmission electron microscopy -- Band gap -- Energy loss function -- Bi2MoxW1−xO6
Semiconductors -- Periodicals
Integrated circuits -- Materials -- Periodicals
Semiconducteurs -- Périodiques
Circuits intégrés -- Matériaux -- Périodiques
Electronic journals
621.38152 - Journal URLs:
- http://www.sciencedirect.com/science/journal/latest/13698001 ↗
http://www.elsevier.com/journals ↗ - DOI:
- 10.1016/j.mssp.2017.02.016 ↗
- Languages:
- English
- ISSNs:
- 1369-8001
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
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- British Library DSC - 5396.440600
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