A comparative X-ray diffraction study of ferroelectric thin films and superlattices. (17th February 2017)

• Record Type: Journal Article
• Authors: Tikhonov, Yu. A.; Zakharchenko, I. N.; Razumnaya, A. G.; Yuzyuk, Y. I.; Pavunny, Sh.; Ortega, N.; Kumar, A.; Katiyar, R. S.
• Is Part Of: Ferroelectrics. Volume 508(2017)
• Page Start: 138
• Page End: 143
• Publication Date: 2017-02-17
• Subjects: Superlattice -- ferroelectric -- XRD -- crystal structure; Ferroelectricity -- Periodicals; Ferroelectric crystals -- Periodicals; 537
• DOI: 10.1080/00150193.2017.1289764
• Languages: English
• ISSNs: 0015-0193

Abstract

ABSTRACT: A number of ferroelectric thin films with various barium concentration and two sets of superlattices with different composition and number of constituent layers were investigated using X-ray diffraction. Out-of-plane unit cell parameters, values of microstrains, and sizes of coherent scattering regions were determined. Modulation period for superlattices was also calculated. We discuss the structural features of the samples.