A comparative X-ray diffraction study of ferroelectric thin films and superlattices. (17th February 2017) - Tikhonov, Yu. A.
ABSTRACT: A number of ferroelectric thin films with various barium concentration and two sets of superlattices with different composition and number of constituent layers were investigated using X-ray diffraction. Out-of-plane unit cell parameters, values of microstrains, and sizes of coherent scattering regions were determined. Modulation period for superlattices was also calculated. We discuss the structural features of the samples.