Cite
APA Citation
Du, X., Liu, S., Luo, D., Zhang, Y., Du, X., He, C., Ren, X., Yang, W., & Yuan, Y. (2017). single event effects sensitivity of low energy proton in Xilinx Zynq-7010 system-on chip. Microelectronics and reliability, 71, 65–70. http://access.bl.uk/ark:/81055/vdc_100045296757.0x00005e