Cite
APA Citation
Chen, R., Chen, W., Guo, X., Shen, C., Zhang, F., Zheng, L., Zhao, W., Ding, L., Luo, Y., Guo, H., Wang, Y., & Liu, Y. (2017). improved on-chip self-triggered single-event transient measurement circuit design and applications. Microelectronics and reliability, 71, 99–105. http://access.bl.uk/ark:/81055/vdc_100045296757.0x000055