Mimicking an Atomically Thin "Vacuum Spacer" to Measure the Hamaker Constant between Graphene Oxide and Silica. Issue 5 (22nd December 2016)

• Record Type: Journal Article
• Authors: Chu, Liangyong; Korobko, Alexander V.; Cao, Anping; Sachdeva, Sumit; Liu, Zhen; de Smet, Louis C. P. M.; Sudhölter, Ernst J. R.; Picken, Stephen J.; Besseling, Nicolaas A. M.
• Is Part Of: Advanced materials interfaces. Volume 4:Issue 5(2017)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2016-12-22
• Subjects: 2D materials -- atomic force microscopy -- graphene oxide -- Hamaker constant -- vacuum spacers; Materials science -- Periodicals; 620.11
• DOI: 10.1002/admi.201600495
• Languages: English
• ISSNs: 2196-7350

Abstract

Abstract : The Hamaker constant between graphene oxide and silica, which quantifies the strength of van der Waals forces is determined, by mimicking a "vacuum spacer" in an atomic force microscopyforce tudy. It is demonstrated that, a 2D spacer is expected to yield an accurately defined separation, owing to the high atom density and strength in planar direction compared with other dimensional spacers.