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APA Citation
Li, X., Qiao, X., Han, W., Lu, Y., Tan, Q., Liu, X., & Tan, P. (2015). layer number identification of intrinsic and defective multilayered graphenes up to 100 layers by the Raman mode intensity from substrates. Nanoscale, 7(17), 8135–8141. http://access.bl.uk/ark:/81055/vdc_100039634984.0x000020