Cite
HARVARD Citation
Li, X. et al. (2015). Layer number identification of intrinsic and defective multilayered graphenes up to 100 layers by the Raman mode intensity from substrates. Nanoscale. 7 (17), pp. 8135-8141. [Online].
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Li, X. et al. (2015). Layer number identification of intrinsic and defective multilayered graphenes up to 100 layers by the Raman mode intensity from substrates. Nanoscale. 7 (17), pp. 8135-8141. [Online].