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HARVARD Citation
Boudier, D. et al. (2017). Low frequency noise assessment in n- and p-channel sub-10 nm triple-gate FinFETs: Part II: Measurements and results. Solid-state electronics. pp. 109-114. [Online].
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Boudier, D. et al. (2017). Low frequency noise assessment in n- and p-channel sub-10 nm triple-gate FinFETs: Part II: Measurements and results. Solid-state electronics. pp. 109-114. [Online].