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APA Citation
Karatsori, T., Theodorou, C., Haendler, S., Dimitriadis, C., & Ghibaudo, G. (2017). drain current local variability from linear to saturation region in 28 nm bulk NMOSFETs. Solid-state electronics, 128, 31–36. http://access.bl.uk/ark:/81055/vdc_100040778786.0x000026