Cite
HARVARD Citation
Karatsori, T. et al. (2017). Drain current local variability from linear to saturation region in 28 nm bulk NMOSFETs. Solid-state electronics. pp. 31-36. [Online].
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Karatsori, T. et al. (2017). Drain current local variability from linear to saturation region in 28 nm bulk NMOSFETs. Solid-state electronics. pp. 31-36. [Online].