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APA Citation
Mohamad, B., Leroux, C., Rideau, D., Haond, M., Reimbold, G., & Ghibaudo, G. (2017). reliable gate stack and substrate parameter extraction based on C-V measurements for 14 nm node FDSOI technology. Solid-state electronics, 128, 10–16. http://access.bl.uk/ark:/81055/vdc_100040778786.0x000019