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APA Citation
Boudier, D., Cretu, B., Simoen, E., Carin, R., Veloso, A., Collaert, N., & Thean, A. (2017). low frequency noise assessment in n- and p-channel sub-10 nm triple-gate FinFETs: Part I: Theory and methodology. Solid-state electronics, 128, 102–108. http://access.bl.uk/ark:/81055/vdc_100040778786.0x000018