Cite
MLA Citation
Omur E. Dagdeviren et al.. “Length Scale and Dimensionality of Defects in Epitaxial SnTe Topological Crystalline Insulator Films.” Advanced materials interfaces, vol. 4, no. 2, 2017, p. n/a. http://access.bl.uk/ark:/81055/vdc_100040594855.0x00000f