Cite
HARVARD Citation
Dagdeviren, O. et al. (2017). Length Scale and Dimensionality of Defects in Epitaxial SnTe Topological Crystalline Insulator Films. Advanced materials interfaces. 4 (2), p. n/a. [Online].
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Dagdeviren, O. et al. (2017). Length Scale and Dimensionality of Defects in Epitaxial SnTe Topological Crystalline Insulator Films. Advanced materials interfaces. 4 (2), p. n/a. [Online].