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APA Citation
Sim, K. S., Teh, V., Tey, Y. C., & Kho, T. K. (n.d.). local dynamic range compensation for scanning electron microscope imaging system by sub‐blocking multiple peak HE with convolution. Scanning, 38(6), 492–501. http://access.bl.uk/ark:/81055/vdc_100039522676.0x000042