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APA Citation

    Lin, Y., Yang, M., Wang, W., Lin, Z., & Li, G. (2016). a low-temperature AlN interlayer to improve the quality of GaN epitaxial films grown on Si substrates. CrystEngComm, 18(46), 8926–8932. http://access.bl.uk/ark:/81055/vdc_100039479448.0x00001e
  
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