Cite
MLA Citation
C. Leclere et al.. “KB scanning of X‐ray beam for Laue microdiffraction on accelero‐phobic samples: application to in situ mechanically loaded nanowires.” Journal of synchrotron radiation, vol. 23, 2016, pp. 1395–1400. http://access.bl.uk/ark:/81055/vdc_100038938437.0x000044