Cite
HARVARD Citation
Leclere, C. et al. (2016). KB scanning of X‐ray beam for Laue microdiffraction on accelero‐phobic samples: application to in situ mechanically loaded nanowires. Journal of synchrotron radiation. pp. 1395-1400. [Online].
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Leclere, C. et al. (2016). KB scanning of X‐ray beam for Laue microdiffraction on accelero‐phobic samples: application to in situ mechanically loaded nanowires. Journal of synchrotron radiation. pp. 1395-1400. [Online].