Enhancement of light-emitting diode reliability using silicone microsphere in encapsulant. (December 2016)
- Record Type:
- Journal Article
- Title:
- Enhancement of light-emitting diode reliability using silicone microsphere in encapsulant. (December 2016)
- Main Title:
- Enhancement of light-emitting diode reliability using silicone microsphere in encapsulant
- Authors:
- Jang, Inseok
Kim, Wan-Ho
Jeon, Sie-Wook
Kim, Hyeon
Kim, Jae-Pil - Abstract:
- Abstract: The aim of this study was to prevent the delamination of encapsulant for light-emitting diode (LED) without sacrificing other optical performance. Silicone microsphere was employed to control the properties of shrinkage and hardness of encapsulant during curing process. The effects of microsphere in encapsulant were investigated by using the different concentration of microsphere. After curing reaction, the shrinkage percentage and hardness of both shore A and D encapsulants were reduced and reinforced, as increasing the concentration of microsphere. Despite the addition of microsphere, the LED packages fabricated without/with microsphere showed the similar initial optical efficiencies. It is because the light scattering effect compensated their small difference of refractive indexes between encapsulants and microsphere. Using the silicone microsphere, the improvement of reliability of LED packages could be achieved after 1000 h under condition of temperature (85 °C)/humidity (RH 85%). It is attributed to the synergy effects of shrinkage suppression and hardness improvement. Highlight: LED encapsulants were prepared with silicone microsphere as a filler material to prevent delamination phenomenon. The shrinkage and hardness of encapsulants were effectively controlled by varying the concentration of microsphere. The enhancement of LED reliability could be achieved by using microsphere without sacrificing other optical performance.
- Is Part Of:
- Microelectronics and reliability. Volume 67(2016)
- Journal:
- Microelectronics and reliability
- Issue:
- Volume 67(2016)
- Issue Display:
- Volume 67, Issue 2016 (2016)
- Year:
- 2016
- Volume:
- 67
- Issue:
- 2016
- Issue Sort Value:
- 2016-0067-2016-0000
- Page Start:
- 94
- Page End:
- 98
- Publication Date:
- 2016-12
- Subjects:
- Silicon microsphere -- Encapsulant -- Shrinkage -- Hardness -- Reliability
Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.microrel.2016.10.009 ↗
- Languages:
- English
- ISSNs:
- 0026-2714
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5758.979000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 1808.xml