Corrigendum to "A subgap density of states modeling for the transient characteristics in oxide-based thin-film transistors" [Microelectron. Reliab. 60 (2016) 67–69]. (December 2016)

Record Type:: Journal Article
Title:: Corrigendum to "A subgap density of states modeling for the transient characteristics in oxide-based thin-film transistors" [Microelectron. Reliab. 60 (2016) 67–69]. (December 2016)
Main Title:: Corrigendum to "A subgap density of states modeling for the transient characteristics in oxide-based thin-film transistors" [Microelectron. Reliab. 60 (2016) 67–69]
Authors:: Wang, Weiliang
Khan, Karim
Zhang, Xingye
Qin, Haiming
Jiang, Jun
Miao, Lijing
Jiang, Kemin
Wang, Pengjun
Dai, Mingzhi
Chu, Junhao
Abstract:
Is Part Of:: Microelectronics and reliability. Volume 67(2016)
Journal:: Microelectronics and reliability
Issue:: Volume 67(2016)
Issue Display:: Volume 67, Issue 2016 (2016)
Year:: 2016
Volume:: 67
Issue:: 2016
Issue Sort Value:: 2016-0067-2016-0000
Page Start:: 159
Page End:
Publication Date:: 2016-12
Subjects:: Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815
Journal URLs:: http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗
DOI:: 10.1016/j.microrel.2016.09.003 ↗
Languages:: English
ISSNs:: 0026-2714
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - 5758.979000
British Library DSC - BLDSS-3PM
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Ingest File:: 1808.xml