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HARVARD Citation
d'Alessandro, V. et al. (2016). Advanced thermal simulation of SiGe:C HBTs including back-end-of-line. Microelectronics and reliability. pp. 38-45. [Online].
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d'Alessandro, V. et al. (2016). Advanced thermal simulation of SiGe:C HBTs including back-end-of-line. Microelectronics and reliability. pp. 38-45. [Online].