Cite
HARVARD Citation
Kot, D. et al. (2016). Investigation of stoichiometry of oxygen precipitates in Czochralski silicon wafers by means of EDX, EELS and FTIR spectroscopy. Superlattices and microstructures. pp. 231-235. [Online].
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Kot, D. et al. (2016). Investigation of stoichiometry of oxygen precipitates in Czochralski silicon wafers by means of EDX, EELS and FTIR spectroscopy. Superlattices and microstructures. pp. 231-235. [Online].