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HARVARD Citation
Jogschies, L. et al. (2016). Stress Reduction in Sputtered Thin NiFe 81/19 Layers for Magnetic Field Sensors. Procedia technology. pp. 162-168. [Online].
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Jogschies, L. et al. (2016). Stress Reduction in Sputtered Thin NiFe 81/19 Layers for Magnetic Field Sensors. Procedia technology. pp. 162-168. [Online].