Topologies for inverter like operation of power cycling tests. (September 2016)

• Record Type: Journal Article
• Authors: Herold, C.; Seidel, P.; Lutz, J.; Bayerer, R.
• Is Part Of: Microelectronics and reliability. Volume 64(2016)
• Page Start: 453
• Page End: 457
• Publication Date: 2016-09
• Subjects: Power cycling test -- IGBT -- Inverter -- Switching losses; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2016.07.130
• Languages: English
• ISSNs: 0026-2714

Abstract

Highlights: Inverter-like operated IGBTs showed expected lifetime for short on-period of 60 ms. New test bench concept for heating by forward and switching losses at low DC link voltage Dimensioning and required circuitry explained