Cite
APA Citation
Cai, M., Yang, D., Zheng, J., Huang, J., Liu, D., Xiao, J., Zhang, P., Zhang, G., & Chen, X. (2016). effects of stress-loading test methods on the degradation of light-emitting diode modules. Microelectronics and reliability, 64, 635–639. http://access.bl.uk/ark:/81055/vdc_100038472167.0x00004b