Accelerated Life Test of high luminosity blue LEDs. (September 2016)

• Record Type: Journal Article
• Authors: Nogueira, E.; Orlando, V.; Ochoa, J.; Fernandez, A.; Vazquez, M.
• Is Part Of: Microelectronics and reliability. Volume 64(2016)
• Page Start: 631
• Page End: 634
• Publication Date: 2016-09
• Subjects: LED -- Accelerated Life Test -- Life models -- Reliability; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2016.07.021
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: A complete Accelerated Life Test on high luminosity blue LEDs is presented. The test was conducted at different temperatures, humidity and current conditions, involving a total of seven individual tests. Life models were obtained for the catastrophic failures of the tests and then a complete temperature, humidity and current model was developed, which enabled the calculation of the life of the LEDs for any of these conditions. Catastrophic failures and model parameters were consistent with earlier results using different high luminosity LEDs. Non-catastrophic failures were modelled with their corresponding luminous power loss on each test, with expected results. Highlights: A complete Accelerated Life Test on high luminosity blue LEDs is presented. The test was conducted at different temperatures, humidity and current conditions. Life models were obtained for the catastrophic failures. Catastrophic failures and model parameters were consistent with earlier results using different high luminosity LEDs.