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HARVARD Citation
Rossetto, I. et al. (2016). Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis. Microelectronics and reliability. pp. 547-551. [Online].
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Rossetto, I. et al. (2016). Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis. Microelectronics and reliability. pp. 547-551. [Online].